A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP) - researchr publication

researchr

You are not signed in
Sign in
Sign up

Richard M. Sedmak, John Evans. A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP). In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 319-327, IEEE Computer Society, 1995.

Abstract is missing.

runs on WebDSL