Mohamed Selim, Eric Jeandeau, Cyril Descleves. Design-Reliability Flow and Advanced Models Address IC-Reliability Issues. In Adrian Evans, Stefano Di Carlo, Praveen Raghavan, Dimitris Gizopoulos, editors, Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016. Volume 1566 of CEUR Workshop Proceedings, pages 1-4, CEUR-WS.org, 2016. [doi]
Abstract is missing.