Skewed Flip-Flop and Mixed-V::t:: Gates for Minimizing Leakage in Sequential Circuits

Jun Seomun, Jae-Hyun Kim, Youngsoo Shin. Skewed Flip-Flop and Mixed-V::t:: Gates for Minimizing Leakage in Sequential Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(11):1956-1968, 2008. [doi]

Abstract

Abstract is missing.