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Jun Seomun, Jae-Hyun Kim, Youngsoo Shin. Skewed Flip-Flop and Mixed-V::t:: Gates for Minimizing Leakage in Sequential Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(11):1956-1968, 2008. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Minimizing leakage power of sequential circuits through mixed-::::V::t:::::: flip-flops and multi-::::V::t:::::: combinational gatesJaehyun Kim, Chungki Oh, Youngsoo Shin. todaes, 15(1), 2009. [doi] Skewed Flip-Flop Transformation for Minimizing Leakage in Sequential CircuitsJun Seomun, Jaehyun Kim, Youngsoo Shin. dac 2007: 103-106 [doi] Minimizing leakage power in sequential circuits by using mixed ::::V::t:::::: flip-flopsJaehyun Kim, Youngsoo Shin. iccad 2007: 797-802 [doi]
The following publications are possibly variants of this publication: