Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell. Zero Cost Test Point Insertion Technique for Structured ASICs. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 357-363, IEEE Computer Society, 2007. [doi]
@inproceedings{SethuramWCB07,
title = {Zero Cost Test Point Insertion Technique for Structured ASICs},
author = {Rajamani Sethuram and Seongmoon Wang and Srimat T. Chakradhar and Michael L. Bushnell},
year = {2007},
doi = {10.1109/VLSID.2007.181},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2007.181},
tags = {testing},
researchr = {https://researchr.org/publication/SethuramWCB07},
cites = {0},
citedby = {0},
pages = {357-363},
booktitle = {20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}