Zero Cost Test Point Insertion Technique for Structured ASICs

Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell. Zero Cost Test Point Insertion Technique for Structured ASICs. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 357-363, IEEE Computer Society, 2007. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.