Saravanan Sethuraman, Venkata Kalyan Tavva, Karthick Rajamani, Chitra K. Subramanian, Kyu-hyoun Kim, Hillery C. Hunter, M. B. Srinivas. Temperature Aware Adaptations for Improved Read Reliability in STT-MRAM Memory Subsystem. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):4635-4644, 2020. [doi]
Abstract is missing.