Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests

Ankit Shah, Raman Nayyar, Arani Sinha. Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests. IEEE Design & Test of Computers, 37(4):7-13, 2020. [doi]

Authors

Ankit Shah

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Raman Nayyar

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Arani Sinha

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