Ankit Shah, Raman Nayyar, Arani Sinha. Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests. IEEE Design & Test of Computers, 37(4):7-13, 2020. [doi]
@article{ShahNS20,
title = {Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests},
author = {Ankit Shah and Raman Nayyar and Arani Sinha},
year = {2020},
doi = {10.1109/MDAT.2020.2968253},
url = {https://doi.org/10.1109/MDAT.2020.2968253},
researchr = {https://researchr.org/publication/ShahNS20},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {37},
number = {4},
pages = {7-13},
}