G. G. Shahidi, James D. Warnock, James Comfort, Stephen E. Fischer, Patricia A. McFarland, Alexandre Acovic, Terry I. Chappell, Barbara A. Chappell, Tak H. Ning, Carl J. Anderson, Robert H. Dennard, J. Y.-C. Sun, Michael R. Polcari, Bijan Davari. CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications. IBM Journal of Research and Development, 39(1-2):229-244, 1995.
Abstract is missing.