On Selecting Testable Paths in Scan Designs

Yun Shao, Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. On Selecting Testable Paths in Scan Designs. J. Electronic Testing, 19(4):447-456, 2003. [doi]

Authors

Yun Shao

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Sudhakar M. Reddy

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Irith Pomeranz

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Seiji Kajihara

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