Yun Shao, Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. On Selecting Testable Paths in Scan Designs. J. Electronic Testing, 19(4):447-456, 2003. [doi]
@article{ShaoRPK03,
title = {On Selecting Testable Paths in Scan Designs},
author = {Yun Shao and Sudhakar M. Reddy and Irith Pomeranz and Seiji Kajihara},
year = {2003},
doi = {10.1023/A:1024648227669},
url = {http://dx.doi.org/10.1023/A:1024648227669},
tags = {testing},
researchr = {https://researchr.org/publication/ShaoRPK03},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {19},
number = {4},
pages = {447-456},
}