Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models

Donald B. Shaw, Dhamin Al-Khalili, Come Rozon. Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integration, 32(1-2):77-97, 2002. [doi]

Authors

Donald B. Shaw

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Dhamin Al-Khalili

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Come Rozon

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