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Donald B. Shaw, Dhamin Al-Khalili, Come Rozon. Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integration, 32(1-2):77-97, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS CircuitsMichael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon. vlsi, 1(4):261-276, 1994. [doi]
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