Donald B. Shaw, Dhamin Al-Khalili, Come Rozon. Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integration, 32(1-2):77-97, 2002. [doi]
@article{ShawAR02,
title = {Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models},
author = {Donald B. Shaw and Dhamin Al-Khalili and Come Rozon},
year = {2002},
doi = {10.1016/S0167-9260(02)00043-3},
url = {http://dx.doi.org/10.1016/S0167-9260(02)00043-3},
tags = {analysis, security},
researchr = {https://researchr.org/publication/ShawAR02},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {32},
number = {1-2},
pages = {77-97},
}