Mohammed Shayan, Virendra Singh, Adit D. Singh, Masahiro Fujita. SEU Tolerant Robust Latch Design. In Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay, editors, Progress in VLSI Design and Test - 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings. Volume 7373 of Lecture Notes in Computer Science, pages 223-232, Springer, 2012. [doi]
Abstract is missing.