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John Paul Shen, Wojciech Maly, F. Joel Ferguson. Inductive Fault Analysis of MOS Integrated Circuits. IEEE Design & Test of Computers, 2(6):13-26, 1985. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A CMOS fault extractor for inductive fault analysisF. Joel Ferguson, John Paul Shen. tcad, 7(11):1181-1194, 1988. [doi] Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault AnalysisJohn Paul Shen, F. Joel Ferguson. itc 1988: 475-484 Detection of multiple faults in MOS circuitsF. Joel Ferguson. tcad, 9(9):1009-1014, 1990. [doi]
The following publications are possibly variants of this publication: