PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits - researchr publication authors

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Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel. PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. In 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), New Frontiers in VLSI Design, 11-12 May 2005, Tampa, FL, USA. pages 212-217, IEEE Computer Society, 2005. [doi]

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