Junhao Shi - researchr alias

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Viewing Publication 1 - 19 from 19

2025

How to Mitigate Overfitting in Weak-to-strong Generalization?Junhao Shi, Qinyuan Cheng, Zhaoye Fei, Yining Zheng, Qipeng Guo, Xipeng Qiu. acl 2025: 16100-16118 [doi]

2024

2023

In Situ Reconfigurable Continuum Robot with Varying Curvature Enabled by Programmable Tensegrity Building BlocksJie Zhang, Junhao Shi, Junhai Huang, Qihuan Wu, Yuwen Zhao, Jinzhao Yang, Hamed Rajabi, Zhigang Wu, Haijun Peng, Jianing Wu. aisy, 5(7), July 2023. [doi]

2022

A Predictive Model of Spindle Thermal Error Based on DCGANJunhao Shi. icmre 2022: 1-5 [doi]

2021

A GAN-based data augmentation method for human activity recognition via the caching abilityJunhao Shi, Decheng Zuo, Zhan Zhang. itl, 4(5), 2021. [doi]

2020

Sensor-based activity recognition independent of device placement and orientationJunhao Shi, Decheng Zuo, Zhan Zhang, Danyan Luo. ett, 31(4), 2020. [doi]

Transition Activity Recognition System based on Standard Deviation Trend AnalysisJunhao Shi, Decheng Zuo, Zhan Zhang. sensors, 20(11):3117, 2020. [doi]

2011

A real-time bimanual 3D interaction method based on bare-hand trackingJunhao Shi, Mingmin Zhang, Zhigeng Pan. mm 2011: 1073-1076 [doi]

2007

Boolean Techniques in Testing of Digital Circuits (Boolesche Techniken zum Testen von digitale Schaltkreise)Junhao Shi. PhD thesis, Bremen University, Germany, 2007. [doi]

2006

Efficiency of Multi-Valued Encoding in SAT-based ATPGGörschwin Fey, Junhao Shi, Rolf Drechsler. ismvl 2006: 25 [doi]

2005

PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial CircuitsJunhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel. isvlsi 2005: 212-217 [doi]

Bridging fault testability of BDD circuitsJunhao Shi, Görschwin Fey, Rolf Drechsler. aspdac 2005: 188-191 [doi]

2004

Synthesis of fully testable circuits from BDDsRolf Drechsler, Junhao Shi, Görschwin Fey. tcad, 23(3):440-443, 2004. [doi]

BDD Circuit Optimization for Path Delay Fault TestabilityGörschwin Fey, Junhao Shi, Rolf Drechsler. dsdm 2004: 168-172 [doi]

2003

MuTaTe: an efficient design for testability technique for multiplexor based circuitsRolf Drechsler, Junhao Shi, Görschwin Fey. glvlsi 2003: 80-83 [doi]

BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault TestabilityJunhao Shi, Görschwin Fey, Rolf Drechsler. ats 2003: 290-293 [doi]

1990

Nonlinear system identification for cascaded block model: an application to electrode polarization impedanceJunhao Shi, Hun H. Sun. tbe, 37(6):574-587, 1990. [doi]

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