Rolf Drechsler, Junhao Shi, Görschwin Fey. MuTaTe: an efficient design for testability technique for multiplexor based circuits. In Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, Washington, DC, USA, April 28-29, 2003. pages 80-83, ACM, 2003. [doi]
Abstract is missing.