Junhao Shi, Görschwin Fey, Rolf Drechsler. Bridging fault testability of BDD circuits. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 188-191, ACM Press, 2005. [doi]
Abstract is missing.