Delay analysis of sub-path on fabricated chips by several path-delay tests - researchr publication authors

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Takanobu Shiki, Yasuhiro Takashima, Yuichi Nakamura. Delay analysis of sub-path on fabricated chips by several path-delay tests. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 1595-1598, IEEE, 2010. [doi]

This author has not been identified. Look up 'Takanobu Shiki' in GoogleThis author has not been identified. Look up 'Yasuhiro Takashima' in GoogleThis author has not been identified. Look up 'Yuichi Nakamura' in Google

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