Takanobu Shiki, Yasuhiro Takashima, Yuichi Nakamura. Delay analysis of sub-path on fabricated chips by several path-delay tests. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 1595-1598, IEEE, 2010. [doi]
@inproceedings{ShikiTN10, title = {Delay analysis of sub-path on fabricated chips by several path-delay tests}, author = {Takanobu Shiki and Yasuhiro Takashima and Yuichi Nakamura}, year = {2010}, doi = {10.1109/ISCAS.2010.5537436}, url = {http://dx.doi.org/10.1109/ISCAS.2010.5537436}, tags = {testing, analysis}, researchr = {https://researchr.org/publication/ShikiTN10}, cites = {0}, citedby = {0}, pages = {1595-1598}, booktitle = {International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France}, publisher = {IEEE}, }