Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki. Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 16-21, IEEE Computer Society, 1997. [doi]
@inproceedings{ShinogiHT97,
title = {Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL},
author = {Tsuyoshi Shinogi and Terumine Hayashi and Kazuo Taki},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090016abs.htm},
tags = {rule-based, testing, logic},
researchr = {https://researchr.org/publication/ShinogiHT97},
cites = {0},
citedby = {0},
pages = {16-21},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}