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Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki. Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 16-21, IEEE Computer Society, 1997. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuitsTsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki. scjapan, 30(7):55-68, 1999. [doi]
The following publications are possibly variants of this publication: