Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki. Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 16-21, IEEE Computer Society, 1997. [doi]
Abstract is missing.