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Impact of Device Aging on Early Mode Failures in Pulsed Latches

Ankur Shukla, Rahul M. Rao, James D. Warnock. Impact of Device Aging on Early Mode Failures in Pulsed Latches. In 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, VLSID 2018, Pune, India, January 6-10, 2018. pages 256-260, IEEE Computer Society, 2018. [doi]

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