Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process - researchr publication authors

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Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong Hua Zhou, Michael G. Pecht. Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process. IEEE Transactions on Reliability, 61(1):50-67, 2012. [doi]

This author has not been identified. Look up 'Xiao-Sheng Si' in GoogleThis author has not been identified. Look up 'Wenbin Wang' in GoogleThis author has not been identified. Look up 'Chang-Hua Hu' in GoogleThis author has not been identified. Look up 'Dong Hua Zhou' in GoogleThis author has not been identified. Look up 'Michael G. Pecht' in Google

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