Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process

Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong Hua Zhou, Michael G. Pecht. Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process. IEEE Transactions on Reliability, 61(1):50-67, 2012. [doi]

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