Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong Hua Zhou, Michael G. Pecht. Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process. IEEE Transactions on Reliability, 61(1):50-67, 2012. [doi]
@article{SiWHZP12,
title = {Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process},
author = {Xiao-Sheng Si and Wenbin Wang and Chang-Hua Hu and Dong Hua Zhou and Michael G. Pecht},
year = {2012},
doi = {10.1109/TR.2011.2182221},
url = {http://dx.doi.org/10.1109/TR.2011.2182221},
researchr = {https://researchr.org/publication/SiWHZP12},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {61},
number = {1},
pages = {50-67},
}