Marcela Simková, Zdenek Kotásek, Cristiana Bolchini. Analysis and comparison of functional verification and ATPG for testing design reliability. In Lukás Sekanina, Görschwin Fey, Jaan Raik, Snorre Aunet, Richard Ruzicka, editors, 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013. pages 275-278, IEEE Computer Society, 2013. [doi]
Abstract is missing.