Optimization of low temperature silicon nitride processes for improvement of device performance

E. Sleeckx, Marc Schaekers, X. Shi, E. Kunnen, B. Degroote, M. Jurczak, M. de Potter de ten Broeck, E. Augendre. Optimization of low temperature silicon nitride processes for improvement of device performance. Microelectronics Reliability, 45(5-6):865-868, 2005. [doi]

Authors

E. Sleeckx

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Marc Schaekers

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X. Shi

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E. Kunnen

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B. Degroote

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M. Jurczak

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M. de Potter de ten Broeck

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E. Augendre

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