Daniel Smale, Steve Haley, Joel Segal, Ronaldo Ronaldo, Svetan M. Ratchev, Richard K. Leach, James D. Claverley. Utilisation of FIB/SEM Technology in the Assembly of an Innovative Micro-CMM Probe. In Svetan M. Ratchev, editor, Precision Assembly Technologies and Systems, 5th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2010, Chamonix, France, February 14-17, 2010. Proceedings. Volume 315 of IFIP, pages 105-112, Springer, 2010. [doi]
@inproceedings{SmaleHSRRLC10,
title = {Utilisation of FIB/SEM Technology in the Assembly of an Innovative Micro-CMM Probe},
author = {Daniel Smale and Steve Haley and Joel Segal and Ronaldo Ronaldo and Svetan M. Ratchev and Richard K. Leach and James D. Claverley},
year = {2010},
doi = {10.1007/978-3-642-11598-1_12},
url = {http://dx.doi.org/10.1007/978-3-642-11598-1_12},
researchr = {https://researchr.org/publication/SmaleHSRRLC10},
cites = {0},
citedby = {0},
pages = {105-112},
booktitle = {Precision Assembly Technologies and Systems, 5th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2010, Chamonix, France, February 14-17, 2010. Proceedings},
editor = {Svetan M. Ratchev},
volume = {315},
series = {IFIP},
publisher = {Springer},
isbn = {978-3-642-11597-4},
}