An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults

Jack Smith, Tian Xia, Charles E. Stroud. An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults. J. Electronic Testing, 22(3):239-253, 2006. [doi]

Authors

Jack Smith

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Tian Xia

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Charles E. Stroud

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