Jack Smith, Tian Xia, Charles E. Stroud. An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults. J. Electronic Testing, 22(3):239-253, 2006. [doi]
@article{SmithXS06,
title = {An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults},
author = {Jack Smith and Tian Xia and Charles E. Stroud},
year = {2006},
doi = {10.1007/s10836-006-9319-7},
url = {http://dx.doi.org/10.1007/s10836-006-9319-7},
tags = {architecture, testing, e-science},
researchr = {https://researchr.org/publication/SmithXS06},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {22},
number = {3},
pages = {239-253},
}