IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science

Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson. IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 935, IEEE Computer Society, 1996.

Authors

Jerry M. Soden

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Richard E. Anderson

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Christopher L. Henderson

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