Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson. IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 935, IEEE Computer Society, 1996.
@inproceedings{SodenAH96,
title = {IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science},
author = {Jerry M. Soden and Richard E. Anderson and Christopher L. Henderson},
year = {1996},
tags = {analysis, e-science},
researchr = {https://researchr.org/publication/SodenAH96},
cites = {0},
citedby = {0},
pages = {935},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}