Performance degradation of an LC-tank VCO by impact of digital switching noise - researchr publication authors

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Charlotte Soens, Geert Van der Plas, Piet Wambacq, Stéphane Donnay. Performance degradation of an LC-tank VCO by impact of digital switching noise. In Michiel Steyaert, C. L. Claeys, editors, 33rd European Solid-State Circuits Conference, ESSCIRC 2004, Leuven, Belgium, September 21-23, 2004. pages 119-122, IEEE, 2004. [doi]

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