Charlotte Soens, Geert Van der Plas, Piet Wambacq, Stéphane Donnay. Performance degradation of an LC-tank VCO by impact of digital switching noise. In Michiel Steyaert, C. L. Claeys, editors, 33rd European Solid-State Circuits Conference, ESSCIRC 2004, Leuven, Belgium, September 21-23, 2004. pages 119-122, IEEE, 2004. [doi]
@inproceedings{SoensPWD04,
title = {Performance degradation of an LC-tank VCO by impact of digital switching noise},
author = {Charlotte Soens and Geert Van der Plas and Piet Wambacq and Stéphane Donnay},
year = {2004},
doi = {10.1109/ESSCIR.2004.1356632},
url = {https://doi.org/10.1109/ESSCIR.2004.1356632},
researchr = {https://researchr.org/publication/SoensPWD04},
cites = {0},
citedby = {0},
pages = {119-122},
booktitle = {33rd European Solid-State Circuits Conference, ESSCIRC 2004, Leuven, Belgium, September 21-23, 2004},
editor = {Michiel Steyaert and C. L. Claeys},
publisher = {IEEE},
}