Influence of trace alloying elements on the ball impact test reliability of SnAgCu solder joints

Jenn-Ming Song, Yao-Ren Liu, Yi-Shao Lai, Ying-Ta Chiu, Ning-Cheng Lee. Influence of trace alloying elements on the ball impact test reliability of SnAgCu solder joints. Microelectronics Reliability, 52(1):180-189, 2012. [doi]

@article{SongLLCL12,
  title = {Influence of trace alloying elements on the ball impact test reliability of SnAgCu solder joints},
  author = {Jenn-Ming Song and Yao-Ren Liu and Yi-Shao Lai and Ying-Ta Chiu and Ning-Cheng Lee},
  year = {2012},
  doi = {10.1016/j.microrel.2011.09.003},
  url = {http://dx.doi.org/10.1016/j.microrel.2011.09.003},
  researchr = {https://researchr.org/publication/SongLLCL12},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {52},
  number = {1},
  pages = {180-189},
}