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Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen. Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electronic Express, 16(8):20190141, 2019. [doi]

Authors

Ruiqiang Song

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Jinjin Shao

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Bin Liang

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Yaqing Chi

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Jianjun Chen

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