Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen. Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electronic Express, 16(8):20190141, 2019. [doi]

@article{SongSLCC19,
  title = {Characterization of P-hit and N-hit single-event transient using heavy ion microbeam},
  author = {Ruiqiang Song and Jinjin Shao and Bin Liang and Yaqing Chi and Jianjun Chen},
  year = {2019},
  doi = {10.1587/elex.16.20190141},
  url = {https://doi.org/10.1587/elex.16.20190141},
  researchr = {https://researchr.org/publication/SongSLCC19},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {16},
  number = {8},
  pages = {20190141},
}