Reduced Pin-Count Test Strategy for 3D Stacked ICs Using Simultaneous Bi-Directional Signaling Based Time Division Multiplexing

Iftikhar A. Soomro, Mohammad Samie, Ian K. Jennions. Reduced Pin-Count Test Strategy for 3D Stacked ICs Using Simultaneous Bi-Directional Signaling Based Time Division Multiplexing. IEEE Access, 9:75892-75904, 2021. [doi]

Abstract

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