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Iftikhar A. Soomro, Mohammad Samie, Ian K. Jennions. Reduced Pin-Count Test Strategy for 3D Stacked ICs Using Simultaneous Bi-Directional Signaling Based Time Division Multiplexing. IEEE Access, 9:75892-75904, 2021. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Test Time Reduction of 3-D Stacked ICs Using Ternary Coded Simultaneous Bidirectional Signaling in Parallel Test PortsIftikhar A. Soomro, Mohammad Samie, Ian K. Jennions. tcad, 39(12):5225-5237, 2020. [doi]
The following publications are possibly variants of this publication: