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Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper. Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectronics Reliability, 43(9-11):1569-1575, 2003. [doi]

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M. S. B. Sowariraj

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Theo Smedes

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Cora Salm

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Ton J. Mouthaan

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Fred G. Kuper

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