Low power latch design in near sub-threshold region to improve reliability for soft error - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Sandeep Sriram, Haiqing Nan, Ken Choi. Low power latch design in near sub-threshold region to improve reliability for soft error. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 611-614, IEEE, 2011. [doi]

This author has not been identified. Look up 'Sandeep Sriram' in GoogleThis author has not been identified. Look up 'Haiqing Nan' in GoogleThis author has not been identified. Look up 'Ken Choi' in Google

runs on WebDSL