Sandeep Sriram, Haiqing Nan, Ken Choi. Low power latch design in near sub-threshold region to improve reliability for soft error. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 611-614, IEEE, 2011. [doi]
Abstract is missing.