Sandeep Sriram, Haiqing Nan, Ken Choi. Low power latch design in near sub-threshold region to improve reliability for soft error. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 611-614, IEEE, 2011. [doi]
@inproceedings{SriramNC11,
title = {Low power latch design in near sub-threshold region to improve reliability for soft error},
author = {Sandeep Sriram and Haiqing Nan and Ken Choi},
year = {2011},
doi = {10.1109/ISQED.2011.5770791},
url = {http://dx.doi.org/10.1109/ISQED.2011.5770791},
tags = {reliability, design},
researchr = {https://researchr.org/publication/SriramNC11},
cites = {0},
citedby = {0},
pages = {611-614},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011},
publisher = {IEEE},
isbn = {978-1-61284-914-0},
}