Wolfgang Stadler, K. Esmark, Harald Gossner, M. Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, E. Gornik. Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability, 42(9-11):1267-1274, 2002. [doi]
@article{StadlerEGSWFPLG02,
title = {Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development},
author = {Wolfgang Stadler and K. Esmark and Harald Gossner and M. Streibl and M. Wendel and Wolfgang Fichtner and Dionyz Pogany and Martin Litzenberger and E. Gornik},
year = {2002},
doi = {10.1016/S0026-2714(02)00133-6},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00133-6},
researchr = {https://researchr.org/publication/StadlerEGSWFPLG02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1267-1274},
}