Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development - researchr publication related

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Wolfgang Stadler, K. Esmark, Harald Gossner, M. Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, E. Gornik. Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability, 42(9-11):1267-1274, 2002. [doi]

The following publications are possibly variants of this publication:

Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phaseK. Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner. mr, 41(11):1761-1770, 2001. [doi]

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